The "cRIO FaultSim6" enables realistic simulation of electrical small signal faults in National Instruments Compact-RIO systems. It was specifically designed for the simulation of fault patterns in conjunction with the cRIO modules "cRIO Resolver Simulator" and "cRIO Position Sensor Simulation."
However, it can also be used independently for simulating fault conditions in a variety of test environments and provides an accurate representation of fault conditions for functional, end-of-line, or lifetime tests.
Technical Description
The FaultSim6 module is used for the simulation of electrical small signal faults and is employed to expand testing capabilities in conjunction with the cRIO modules "cRIO Resolver Simulator" and "cRIO Position Sensor Simulation." It enables the simulation of various fault patterns such as:
Short circuit (e.g., to ground or to another line)
Line interruption
Interference due to noise or signal distortions
By combining multiple modules, different test configurations can be realized. The various fault conditions can be implemented through two fault buses.
The fault bus on a fault simulation card (often used in the electronics and automotive industry) is a special wiring system designed to deliberately simulate fault conditions in electrical circuits or control units.
The "cRIO FaultSim6" enables realistic simulation of electrical small signal faults in National Instruments Compact-RIO systems. It was specifically designed for the simulation of fault patterns in conjunction with the cRIO modules "cRIO Resolver Simulator" and "cRIO Position Sensor Simulation."
However, it can also be used independently for simulating fault conditions in a variety of test environments and provides an accurate representation of fault conditions for functional, end-of-line, or lifetime tests.
Technical Description
The FaultSim6 module is used for the simulation of electrical small signal faults and is employed to expand testing capabilities in conjunction with the cRIO modules "cRIO Resolver Simulator" and "cRIO Position Sensor Simulation." It enables the simulation of various fault patterns such as:
Short circuit (e.g., to ground or to another line)
Line interruption
Interference due to noise or signal distortions
By combining multiple modules, different test configurations can be realized. The various fault conditions can be implemented through two fault buses.
The fault bus on a fault simulation card (often used in the electronics and automotive industry) is a special wiring system designed to deliberately simulate fault conditions in electrical circuits or control units.
Technical Specification
Switching Paths: 6
Fault Bus: 2 Channels
Maximum Switching Current: 1.5A
Software: Example software for the cRIO available in LabVIEW
Application Areas
Simulation of Fault Patterns in Combination with cRIO Modules:
In conjunction with the “cRIO Resolver Simulator” and “cRIO Position Sensor Simulation,” the FaultSim6 allows for precise simulation of fault conditions, e.g., in function, end-of-line, and lifetime tests.
Standalone Fault Simulation in Testing Environments:
The module can be used independently to accurately simulate various fault patterns of small signals, thus testing the robustness and functionality of control devices and sensors.Medical Technology: Validation of devices operating in safety-critical environments.
Due to its flexible configuration and integration into existing systems, the “cRIO FaultSim6” module provides an efficient solution for simulating fault patterns, both independently and in combination with the cRIO modules “cRIO Resolver Simulator” and “cRIO Position Sensor Simulation,” in various industrial applications.
Technical Specification
Switching Paths: 6
Fault Bus: 2 Channels
Maximum Switching Current: 1.5A
Software: Example software for the cRIO available in LabVIEW
Application Areas
Simulation of Fault Patterns in Combination with cRIO Modules:
In conjunction with the “cRIO Resolver Simulator” and “cRIO Position Sensor Simulation,” the FaultSim6 allows for precise simulation of fault conditions, e.g., in function, end-of-line, and lifetime tests.
Standalone Fault Simulation in Testing Environments:
The module can be used independently to accurately simulate various fault patterns of small signals, thus testing the robustness and functionality of control devices and sensors.Medical Technology: Validation of devices operating in safety-critical environments.
Due to its flexible configuration and integration into existing systems, the “cRIO FaultSim6” module provides an efficient solution for simulating fault patterns, both independently and in combination with the cRIO modules “cRIO Resolver Simulator” and “cRIO Position Sensor Simulation,” in various industrial applications.
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