Custom Hardware Components

We develop custom hardware components according to your requirements and tailored to your environment. A particular area of expertise is focused on solutions for parallel testing with a variety of test objects/channels.

Examples include:

• Measurement system for controlling and monitoring test objects with a variety of connections (e.g., automotive body controllers)

  • 128 analog inputs with sampling rates of up to 1 MHz

  • 100 switching outputs (relays, open-drain, open-collector)

  • 10 CAN interfaces

  • 10 serial interfaces

  • 22 digital I/Os

• Test systems with power sources for pulse testing of LEDs

  • up to 280 channels in a 19" rack

  • Currents from 100 µA to 6 A

  • Pulse duration from 1 µs to 10 s

• Test systems for characterizing battery cells

  • up to 240 channels in a 19" rack

  • parallel charging/discharging of the cells with up to 10 A per cell

  • Measurement of cell voltage, capacity, and internal resistance

To realize these systems, we use among others:

• Embedded systems from National Instruments (PXI, cRIO, sbRIO)

• Microcontrollers from STMicroelectronics

• FPGAs from Xilinx

• High-precision analog-to-digital converters from Analog Devices

Even during development, we pay attention to EMV-compliant hardware design. We test the interference immunity and emissions of our devices in our in-house EMV laboratory.